The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2019

Filed:

Jun. 30, 2016
Applicants:

Junghyun Kwon, Cupertino, CA (US);

Ramya Narasimha, Palo Alto, CA (US);

Edward L. Schwartz, Menlo Park, CA (US);

Max Mcfarland, Sunnyvale, CA (US);

Silvio Savarese, Stanford, CA (US);

Kathrin Berkner, Los Altos, CA (US);

Inventors:

Junghyun Kwon, Cupertino, CA (US);

Ramya Narasimha, Palo Alto, CA (US);

Edward L. Schwartz, Menlo Park, CA (US);

Max McFarland, Sunnyvale, CA (US);

Silvio Savarese, Stanford, CA (US);

Kathrin Berkner, Los Altos, CA (US);

Assignee:

Ricoh Co., Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06K 9/46 (2006.01); G06Q 30/02 (2012.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06F 17/3028 (2013.01); G06F 17/30247 (2013.01); G06F 17/30259 (2013.01); G06K 9/4628 (2013.01); G06K 9/4647 (2013.01); G06K 9/6212 (2013.01); G06K 9/6292 (2013.01); G06Q 30/0201 (2013.01); G06F 17/30256 (2013.01);
Abstract

A system and method for determining an object or product represented in an image is disclosed. The system receives a first image, determines a region of interest in the first image, determines a classification score for the region of interest using a convolutional neural network that assigns the region of interest the classification score corresponding to a class, and identifies a first product in the first image based on the classification score.


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