The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2019
Filed:
Mar. 04, 2016
Tata Consultancy Services Limited, Mumbai, IN;
Rahul Sinha, Bangalore, IN;
Balamuralidhar Purushothaman, Bangalore, IN;
Tapas Chakravarty, Kolkata, IN;
Tata Consultancy Services Limited, Mumbai, IN;
Abstract
Disclosed is a method and system for reducing data size of raw data. The system may process the raw data for calculating Renyi entropies, Wigner Ville Distributions (WVD's), Wigner Ville Spectrum (WVS) and Renyi divergence. The system may identify a first set of windows followed by a second set of windows while processing the raw data. Further, the system may calculate Eigen values for a Time-Frequency matrix of WVS of the second set of windows. The system may filter the second set of windows based on the Eigen values for preparing a third set of windows. The system prepares clusters of the Eigen values. The system may compute centroids of the clusters of the Eigen values. The system classifies each window of the third set of windows into one of the clusters indicating a relevant category of event identified from the raw data.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile