The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2019
Filed:
Apr. 10, 2017
Microsoft Technology Licensing, Llc, Redmond, WA (US);
Suresh Thummalapenta, Bellevue, WA (US);
Jacek Andrzej Czerwonka, Sammamish, WA (US);
Shuvendu K. Lahiri, Sammamish, WA (US);
Nikolaj Skallerud Bjorner, Woodinville, WA (US);
August Shi, Urbana, IL (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
The factorization of test components when performing component-level regression testing in iterative builds of a computing system that consists of many working components. Performance metrics for test components are maintained across multiple builds of the computing program. To perform factorization, multiple factorings of a test component are identified and evaluated until a suitable improvement in the maintained performance metric for each corresponding test component is achieved (e.g., via simulation). This may be performed, across multiple of the test components. This process may be iterated through such that the set of test components being factored and evaluated in a subsequent iteration may in fact be a test component created by factorization in a prior iteration. The net result is that the factorization achieves improvement in performance metrics of the test components.