The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2019

Filed:

Apr. 17, 2017
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Daijiro Murata, Tokyo, JP;

Jun Maeoka, Tokyo, JP;

Genta Koreki, Tokyo, JP;

Kiyoshi Yamaguchi, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 17/30952 (2013.01); G06F 17/30979 (2013.01);
Abstract

A test input information search device searches for a candidate for test inputting in a database, and stores information of the database including a plurality of elements configured with a first structure, stores screen information including the plurality of elements configured with a second structure and displayed, identifies, from the second structure, relation between the elements in the plurality of elements included in the screen information, and searches for, based on the identified relation between the elements, the plurality of elements as the candidate for the test inputting from the information of the database.


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