The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2019
Filed:
May. 26, 2015
Applicant:
Samsung Electronics Co., Ltd., Gyeonggi-do, KR;
Inventors:
Sungjong Seo, Gyeonggi-do, KR;
Jongmin Kim, Gyeonggi-do, KR;
Assignee:
Samsung Electronics Co., Ltd, , KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 3/06 (2006.01); G06F 12/02 (2006.01); G06F 17/00 (2019.01);
U.S. Cl.
CPC ...
G06F 3/0653 (2013.01); G06F 3/0605 (2013.01); G06F 3/0608 (2013.01); G06F 3/0631 (2013.01); G06F 3/0644 (2013.01); G06F 3/0679 (2013.01); G06F 12/02 (2013.01); G06F 17/00 (2013.01);
Abstract
Disclosed is a method of analyzing fragmentation of an electronic device, which comprises: receiving information on at least one allocation unit of a memory; and calculating fragmentation ratio information on the basis of the received information on at least one allocation unit.
Seo, Sungjong. (2019). Electronic device and method of analyzing fragmentation of electronic device (U.S. Patent No. 10241718). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10241718
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