The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2019

Filed:

Apr. 24, 2018
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Tsuyoshi Shimada, Toride, JP;

Kumiko Takizawa, Saitama, JP;

Eileen Takeuchi, Toride, JP;

Ikuyo Kuroiwa, Tokyo, JP;

Wataru Kitamura, Abiko, JP;

Kan Tanabe, Matsudo, JP;

Haruhiko Mitsuda, Nagareyama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 5/14 (2006.01); G03G 7/00 (2006.01); G03G 15/02 (2006.01); G03F 7/09 (2006.01); B82Y 30/00 (2011.01);
U.S. Cl.
CPC ...
G03G 7/0086 (2013.01); G03F 7/092 (2013.01); G03G 15/0216 (2013.01); B82Y 30/00 (2013.01);
Abstract

There is provided an electrophotographic photosensitive member, a process cartridge and an electrophotographic apparatus that are excellent in charging properties and can suppress residual potential in the case where a strontium titanate particle is used as a metal oxide particle in an undercoat layer of the electrophotographic photosensitive member. An electrophotographic photosensitive member in which an undercoat layer contains a strontium titanate particle having a maximum peak at a position of 2θ=32.20±0.20 (θ represents a Bragg angle) in a CuKα characteristic X-ray diffraction pattern, the maximum peak having a half-value width of 0.10 deg or more and 0.50 deg or less, and a process cartridge and an electrophotographic apparatus each provided with the electrophotographic photosensitive member.


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