The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2019

Filed:

Nov. 13, 2015
Applicant:

Sharp Kabushiki Kaisha, Sakai, Osaka, JP;

Inventors:

Etsuo Yamamoto, Sakai, JP;

Hiroyuki Ohkawa, Sakai, JP;

Shige Furuta, Sakai, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F 1/1345 (2006.01); G09G 3/36 (2006.01); G09F 9/00 (2006.01); G09F 9/30 (2006.01); G09G 3/20 (2006.01); G09G 3/00 (2006.01);
U.S. Cl.
CPC ...
G02F 1/13458 (2013.01); G09F 9/00 (2013.01); G09F 9/30 (2013.01); G09G 3/006 (2013.01); G09G 3/20 (2013.01); G09G 3/3648 (2013.01); G09G 3/3688 (2013.01); G02F 1/1345 (2013.01); G09G 2300/0426 (2013.01); G09G 2320/0214 (2013.01); G09G 2330/12 (2013.01);
Abstract

An object of the present invention is to realize a display device having a layered wiring structure, that is capable of detecting leakage without fail by using a simple testing circuit. Source bus lines (SL) are wired such that, in the layered region, two source bus lines (SL) adjacent in a vertical direction are a combination of a source bus line (SL) of an odd-numbered column and a source bus line (SL) of an even-numbered column, and two source bus lines (SL) adjacent in a horizontal direction are a combination of a source bus line (SL) of an odd-numbered column and a source bus line (SL) of an even-numbered column. Potentials of different magnitudes are supplied respectively to source bus lines (SL) of odd-numbered columns and source bus lines (SL) of even-numbered columns via testing lines.


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