The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2019
Filed:
Aug. 26, 2015
Olympus Corporation, Tokyo, JP;
Yoshimasa Suzuki, Kawasaki, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
A sample observation method includes an acquisition of for acquiring an electronic image of a sample, and a subtraction step of subtracting a DC component from a signal of the electronic image, and the acquisition step is performed in a state of bright-field observation, the electronic image at the subtraction step is an image acquired in a first predetermined state, and in the first predetermined state, at least a position of the sample and a in-focus position of an image forming optical system are different. A sample observation device includes a light source, an illumination optical system, an image forming optical system, an image-pickup device, and an image processing device, and the illumination optical system is disposed so as to irradiate a sample with illumination light from the light source, the image forming optical system is disposed so that light from the sample is incident thereon and an optical image of the sample is formed, the image-pickup device is disposed at a position of the optical image, and the image processing device is configured to implement the aforementioned sample observation method.