The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2019

Filed:

Jul. 26, 2013
Applicants:

Centre National DE LA Recherche Scientifique, Paris, FR;

Universite Du Maine, Le Mans, FR;

Universite D'aix-marseille, Marseilles, FR;

Inventors:

Dominique Ausserré, Soulitré, FR;

Ludovic Roussille, Marseilles, FR;

Myriam Zerrad, Marseilles, FR;

Fabien Lemarchand, Cabries, FR;

Claude Amra, Marseilles, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/552 (2006.01); G02B 21/06 (2006.01); G01N 33/543 (2006.01); G01N 33/551 (2006.01); G01N 21/359 (2014.01); G01N 21/59 (2006.01); G01N 21/03 (2006.01); G01N 21/84 (2006.01); G02B 21/33 (2006.01); G02B 21/34 (2006.01);
U.S. Cl.
CPC ...
G02B 21/06 (2013.01); G01N 21/03 (2013.01); G01N 21/359 (2013.01); G01N 21/59 (2013.01); G01N 21/8422 (2013.01); G01N 33/54373 (2013.01); G01N 33/551 (2013.01); G02B 21/33 (2013.01); G02B 21/34 (2013.01);
Abstract

The invention relates to a method for observing a sample under optical microscopy, in incoherent, unpolarised light, using a sample substrate including a contrast-amplifying layer having a complex index of refraction. The invention also relates to a method for detecting or metering at least one chemical or biological species using such a sample substrate.


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