The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2019
Filed:
Jun. 03, 2013
Ffei Limited, Hemel Hempstead, GB;
Martin Philip Gouch, Hemel Hempstead, GB;
Craig Revie, Hemel Hempstead, GB;
Peter Walsh, Hemel Hempstead, GB;
Jacqueline Margaret Deane, Hemel Hempstead, GB;
FFEI Limited, Hertfordshire, GB;
Abstract
A method of forming an imaging calibration device for a biological material imaging system, the method comprises: providing one or more discrete regions upon or within a retaining member, each region for the receipt of a selected predetermined biological stain material; selecting one or more predetermined biological stain materials, wherein each of the selected predetermined biological stain materials has a predetermined optical response, and providing one or more of the selected predetermined biological stain materials to the said one or more discrete regions such that the said material is localised in the said region.