The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2019

Filed:

Sep. 25, 2015
Applicant:

Massachusetts Institute of Technology, Cambridge, MA (US);

Inventors:

Bryan M. Reid, Chelmsford, MA (US);

Mark Silver, Bedford, MA (US);

Robert Martinez, Providence, RI (US);

Alan Decew, West Newton, MA (US);

Adam Shabshelowitz, Cambridge, MA (US);

Michael Chrisp, Burlington, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B64G 1/66 (2006.01); G02B 17/08 (2006.01); G02B 23/16 (2006.01); G02B 7/182 (2006.01); G02B 7/183 (2006.01);
U.S. Cl.
CPC ...
G02B 7/183 (2013.01); B64G 1/66 (2013.01); G02B 7/1827 (2013.01); G02B 17/0808 (2013.01); G02B 23/16 (2013.01);
Abstract

An imaging system includes a metering structure and a plurality of foldable members disposed around a periphery of the metering structure. Each foldable member in the plurality of foldable members includes an arm comprising a strain deployable composite and a reflector disposed on the arm. The arm in a respective foldable member in the plurality of foldable members is configured to hold the respective foldable member toward the metering structure in a first state and to hold the respective foldable member away from the metering structure in a second state such that the reflector of the respective foldable member forms part of a sparse aperture in the second state.


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