The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2019
Filed:
Aug. 12, 2015
Cornell University, Ithaca, NY (US);
David Erickson, Ithaca, NY (US);
Pilgyu Kang, Ithaca, NY (US);
CORNELL UNIVERSITY, Ithaca, NY (US);
Abstract
A method for characterizing an interaction between a first particle and a second particle is provided. The method includes the steps of: (i) providing an optical trap system including a photonics-based trap, a light source, and a camera; (ii) optically trapping, using the photonics-based trap, the first particle; (iii) obtaining a first measurement of a trap stiffness of the photonics-based trap; (iv) introducing the second particle to the optically trapped particle; (v) incubating the first and second particles under conditions suitable for an interaction between the first and second particles; (vi) obtaining a second measurement of the trap stiffness of the photonics-based trap after the incubation; and (vii) determining, using the first measurement of trap stiffness and the second measurement of trap stiffness, a property of the interaction between the first particle and the second particle.