The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2019

Filed:

Mar. 20, 2015
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Michel Paul Jurriaan Jurrissen, Eindhoven, NL;

Johannes Petrus Groen, Eindhoven, NL;

Miha Fuderer, Eindhoven, NL;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/00 (2006.01); G01R 33/565 (2006.01); G01R 33/561 (2006.01); G01R 33/48 (2006.01); G01R 33/58 (2006.01); A61K 6/00 (2006.01);
U.S. Cl.
CPC ...
G01R 33/56554 (2013.01); G01R 33/4818 (2013.01); G01R 33/5611 (2013.01); G01R 33/5616 (2013.01); G01R 33/56545 (2013.01); G01R 33/583 (2013.01); A61B 2217/00 (2013.01); A61K 6/00 (2013.01); G01R 1/00 (2013.01);
Abstract

In an EPI acquisition sequence for magnetic resonance signals k-space is scanned along sets of lines in k-space along opposite propagation directions, e.g. odd and even lines in k-space. Phase errors that occur due to the opposite propagation directions are corrected for in a SENSE-type parallel imaging reconstruction. The phase error distribution in image space may be initially estimated, calculated form the phase difference between images reconstructed from magnetic resonance signals acquired from the respective sets of k-space lines, or from an earlier dynamic.


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