The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2019
Filed:
Mar. 02, 2018
Applicant:
Riken, Wako-shi, Saitama, JP;
Inventors:
Yoshie Otake, Wako, JP;
Yoshimasa Ikeda, Wako, JP;
Assignee:
RIKEN, Saitama, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 3/06 (2006.01); G01V 5/00 (2006.01); G01N 23/204 (2006.01);
U.S. Cl.
CPC ...
G01N 23/204 (2013.01); G01T 3/06 (2013.01); G01V 5/0025 (2013.01);
Abstract
A non-destructive inspection deviceusing backscattering of neutrons includes a neutron sourcethat radiates a pulse neutron beam to a surfaceof an inspection target, a neutron detection devicethat detects scattered neutrons scattered in the inspection targetand returned, and a measurement devicethat measures the detection number of scattered and returned neutrons detected by the neutron detection deviceand generates detection number data expressing the detection number with respect to time.