The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2019

Filed:

Dec. 11, 2012
Applicant:

Valeo Systemes DE Controle Moteur, Cergy Saint Christophe, FR;

Inventors:

Larbi Bendani, Meru, FR;

Mimoun Askeur, Vaureal, FR;

Assignee:

VALEO SYSTEMES DE CONTROLE MOTEUR, Cergy Saint Christophe, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 13/00 (2006.01); G01K 7/22 (2006.01); G01K 7/24 (2006.01);
U.S. Cl.
CPC ...
G01K 13/00 (2013.01); G01K 7/22 (2013.01); G01K 7/24 (2013.01);
Abstract

The invention relates to a method for measuring the temperature of at least one electronic component () using a sensor () that supplies a temperature-dependent voltage. The method comprises the following steps in which: a signal representative of the voltage delivered by the sensor () is made to pass through an isolated differential amplifier (), and the signal output from said isolated differential amplifier () is used to determine the temperature measured by the sensor ().


Find Patent Forward Citations

Bendani, Larbi. (2019). Temperature measurement method (U.S. Patent No. 10240987). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10240987

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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