The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10240950 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 26, 2019

Filed:

Jan. 05, 2015
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Takashi Fukuhara, Higashikurume, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/347 (2006.01); B23K 26/08 (2014.01);
U.S. Cl.
CPC ...
G01D 5/34707 (2013.01); B23K 26/0823 (2013.01);
Abstract

A scale is configured to measure a displacement or velocity of a rotating object. The scale includes a first region that includes a first mark row including a plurality of marks arranged in a first period, and a second region that includes a second mark row including a plurality of marks arranged in a second period having a phase continuity with the first mark row formed in the first region. A periodic mark row including the first mark row and the second mark row is formed over an entire circumference of the rotating object including the first region and the second region.


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Fukuhara, Takashi. (2019). Scale, measuring apparatus, image formation apparatus, scale fabricating unit, and scale fabrication method (U.S. Patent No. 10240950). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10240950

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