The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2019

Filed:

Feb. 11, 2013
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Remco Theodorus Johannes Muijs, Meteren, NL;

Chris Damkat, Eindhoven, NL;

Frederik Jan De Bruijn, Eindhoven, NL;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01P 3/36 (2006.01); G01B 11/16 (2006.01); G01B 9/02 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/162 (2013.01); A61B 5/0059 (2013.01); G01B 9/02095 (2013.01);
Abstract

An apparatus for determining a propagation velocity for a surface wave comprises a coherent light source () for generating at least a first and a second light spot on a surface (). A camera () captures at least one out-of-focus image of at least a part of the surface () comprising the light spots. The out-of-focus image comprises light spot image objects for the light spots where the light spot image objects have speckle patterns. An analyzer () determines the propagation velocity in response to a time difference between speckle pattern changes in the two speckle patterns. The camera may specifically use a rolling shutter allowing the determination of the propagation velocity to be based on a spatial analysis of the speckle patterns. The approach may in particular allow an efficient remote measuring of pulse wave velocities e.g. in animal tissue and in particular, in human tissue.


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