The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2019

Filed:

Mar. 25, 2015
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Kana Tanaka, Tokyo, JP;

Koichi Hirokawa, Tokyo, JP;

Yukio Kumagai, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/02 (2006.01); A61B 6/03 (2006.01); A61B 6/06 (2006.01); A61B 6/04 (2006.01);
U.S. Cl.
CPC ...
A61B 6/542 (2013.01); A61B 6/027 (2013.01); A61B 6/032 (2013.01); A61B 6/0407 (2013.01); A61B 6/06 (2013.01); A61B 6/4435 (2013.01); A61B 6/461 (2013.01); A61B 6/467 (2013.01); A61B 6/488 (2013.01); A61B 6/5205 (2013.01); A61B 6/545 (2013.01);
Abstract

In order to provide an X-ray CT apparatus and the like capable of obtaining an optimal X-ray dose for a dynamically changing X-ray irradiation region and reliably irradiating the X-ray irradiation region in a case where X-rays are applied with a spreading angle in a body axis direction, an X-ray CT apparatusdynamically changes an X-ray irradiation regionfor each view angle during scanning, and a system control devicechanges a position of an analysis lineused to calculate an optimal tube current during scanning according to a position of the X-ray irradiation regionat each view angle, so as to obtain an optimal irradiation X-ray dose.


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