The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2019

Filed:

Sep. 07, 2018
Applicant:

Anritsu Company, Morgan Hill, CA (US);

Inventor:

Donald Anthony Bradley, Morgan Hill, CA (US);

Assignee:

ANRITSU COMPANY, Morgan Hill, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 4/00 (2018.01); H04W 24/06 (2009.01); H04B 17/345 (2015.01); H04B 17/00 (2015.01);
U.S. Cl.
CPC ...
H04W 24/06 (2013.01); H04B 17/0085 (2013.01); H04B 17/345 (2015.01);
Abstract

A measuring instrument for detecting a source of passive intermodulation (PIM) includes a signal source, a reference signal source, and a first transmitter module and a second transmitter module each configured to receive a signal from the signal source and a reference signal from the reference signal source and generate a tone at a first frequency and a second frequency, respectively. The measuring instrument further includes a receiver and a receiver module configured to receive the signal from the signal source and a harmonic of the test signal generated by a source of PIM to generate a sample signal at the fixed frequency of the reference signal. The receiver is configured to determine a shift in phase between the reference signal and the sample signal. The receiver determines an estimate of distance to the source of PIM using determinations of the shift in phase as the signal source is swept.


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