The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2019

Filed:

Jan. 30, 2018
Applicant:

Ambarella, Inc., Santa Clara, CA (US);

Inventors:

Leslie D. Kohn, Saratoga, CA (US);

Peter Verplaetse, Redwood City, CA (US);

Assignee:

Ambarella, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 19/513 (2014.01); H04N 19/52 (2014.01); H04N 19/159 (2014.01);
U.S. Cl.
CPC ...
H04N 19/513 (2014.11);
Abstract

An apparatus includes a first circuit and a second circuit. The first circuit may be configured to (i) fetch a reference samples from a memory to slots in a buffer, (ii) generate motion vectors by motion estimating inter-prediction candidates of a current picture relative to the reference samples in the buffer, (iii) snoop the fetches from the memory to determine if the reference samples fetched for a non-zero motion vector type of the inter-prediction candidates includes the reference samples for a zero motion vector type of the inter-prediction candidates and (iv) avoid duplication of the fetches for the zero motion vector type of the inter-prediction candidates where the snoop determines that the reference samples have already been fetched. The second circuit may be configured to evaluate the reference samples in the buffer based on the motion vectors to select a prediction sample unit made of the reference samples.


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