The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2019
Filed:
Sep. 07, 2018
Applicant:
7d Labs, Inc., San Francisco, CA (US);
Inventors:
Carl Magnus Wrenninge, San Francisco, CA (US);
Carl Jonas Magnus Unger, San Francisco, CA (US);
Assignee:
7D Labs, Inc., San Francisco, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6256 (2013.01);
Abstract
A method for synthetic data generation and analysis including: determining a set of parameter values; generating a scene based on the parameter values; rendering a synthetic image of the scene; and generating a synthetic dataset including a set of synthetic images.
Wrenninge, Carl. (2019). Method for image analysis (U.S. Patent No. 10235601). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10235601
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile