The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2019

Filed:

Jun. 13, 2016
Applicant:

Sys-tech Solutions, Inc., Princeton, NJ (US);

Inventors:

Matthias Voigt, Lawrenceville, NJ (US);

Michael L. Soborski, Allentown, NJ (US);

Rafik Ayoub, Princeton Junction, NJ (US);

Assignee:

Sys-Tech Solutions, Inc., Princeton, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06K 9/62 (2006.01); G06K 7/10 (2006.01); G06K 19/06 (2006.01); G06K 7/14 (2006.01); G06K 9/46 (2006.01); G06K 9/18 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6215 (2013.01); G06F 17/30256 (2013.01); G06F 17/30277 (2013.01); G06K 7/10861 (2013.01); G06K 7/1413 (2013.01); G06K 7/1447 (2013.01); G06K 7/1452 (2013.01); G06K 9/18 (2013.01); G06K 9/4604 (2013.01); G06K 19/06028 (2013.01); G06K 19/06037 (2013.01);
Abstract

According to various implementations, a computing device receives an image of a candidate mark and uses the image to create a profile of a feature of the mark. The computing device filters out, from the profile, all spatial frequency components except for a first band of spatial frequency components, resulting in a first filtered profile for the feature. The computing device repeats this filtering process for a second band of spatial frequency components, resulting in a second filtered profile for the feature, and may repeat this filtering process for further spatial frequency bands. The computing device compares the first filtered profile of the candidate mark with an equivalent first filtered profile of a genuine mark, and may repeat this process for further filtered profiles.


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