The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2019

Filed:

Nov. 28, 2017
Applicant:

Jeffrey M. Sieracki, Silver Spring, MD (US);

Inventor:

Jeffrey M. Sieracki, Silver Spring, MD (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4604 (2013.01); G06K 9/00664 (2013.01);
Abstract

A method and system are provided for parallactically synced acquisition of images about a common target from mutually displaced imaging positions. At least first and second imaging devices are disposed respectively at first and second imaging positions. The first imaging device is actuated to acquire a first image with a target of interest disposed at a predetermined relative position within a field of view thereof. The second imaging device is actuated to acquire a second image with the target of interest disposed within a field of view thereof. A target feature finder is executed in a processor to detect the target of interest within the second image. A plurality of user prompts are generated at the second imaging device responsive to detection of the target of interest in the second image. The user prompts include: visual indicia adaptively applied to the second image to visually distinguish the target of interest, and orientation correction alerts adaptively generated to guide angular displacement of the second imaging device to situate the target of interest at the predetermined relative position within its field of view.


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