The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2019
Filed:
May. 24, 2017
Elbit Systems Land and C4i Ltd., Netanaya, IL;
Ilya Leizerson, Netanaya, IL;
ELBIT SYSTEMS LAND AND C4I LTD., Netanaya, IL;
Abstract
A system for determining the authenticity of an object including a reference-image acquisition module for acquiring a reference-image. The reference-image acquisition module includes a light-source, an imager including an imaging-sensor, and a database coupled with the imager for storing the reference-image. The light-source directs circumferential-light toward an authentication-region on the object. The circumferential-light is at least one of collimated and telecentric. The circumferential-light impinges on the authentication-region from a plurality of different azimuthal directions and at a predetermined oblique angle relative to the normal of a plane defined by said object. A portion of the circumferential-light is reflected from the authentication-region toward a specular reflection region and another portion is scattered from the authentication-region. The imager is focused on the authentication-region and acquires a reference-image. The reference-image is a focused image of the scattered light. The reference-image includes image features related to surface features scattering phenomena of the authentication-region.