The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2019
Filed:
Dec. 11, 2014
Sivakumar N, Coimbatore, IN;
Tu Truong, San Jose, CA (US);
Nalini Chandhi, Fremont, CA (US);
Nethaji Tummuru, Sunnyvale, CA (US);
Manikanta Pachineelam, Union City, CA (US);
Mario Ponce, Santa Clara, CA (US);
Chao Zhou, Los Gatos, CA (US);
Rahul Kabra, Sunnyvale, CA (US);
Sakshi Chopra, Fremont, CA (US);
Zhenhua Luo, Mountain View, CA (US);
Jaehun Jeong, San Jose, CA (US);
Sivakumar N, Coimbatore, IN;
Tu Truong, San Jose, CA (US);
Nalini Chandhi, Fremont, CA (US);
Nethaji Tummuru, Sunnyvale, CA (US);
Manikanta Pachineelam, Union City, CA (US);
Mario Ponce, Santa Clara, CA (US);
Chao Zhou, Los Gatos, CA (US);
Rahul Kabra, Sunnyvale, CA (US);
Sakshi Chopra, Fremont, CA (US);
Zhenhua Luo, Mountain View, CA (US);
Jaehun Jeong, San Jose, CA (US);
SAP SE, Walldorf, DE;
Abstract
Systems, methods, and apparatuses for activity pattern detection are described herein. Embodiments may process large amounts of data from a plurality of different database sources in order to detect events common to the data of the different database sources. Embodiments further perform data mining operations to detect patterns (e.g., two or more events appearing consecutively or non-consecutively), and present these patterns in a graphical user interface (GUI) to illustrate how a plurality of patterns may comprise a business scenario.