The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2019

Filed:

Feb. 19, 2013
Applicant:

Keysight Technologies, Inc., Minneapolis, MN (US);

Inventors:

Andrew Robert Lehane, Edinburgh, GB;

Antony Kirkham, Edinburgh, GB;

Martin Ware Curran-Gray, South Queensferry, GB;

Assignee:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03F 1/26 (2006.01); G06F 17/00 (2019.01); G01R 13/02 (2006.01);
U.S. Cl.
CPC ...
G06F 17/00 (2013.01); G01R 13/0254 (2013.01); G01R 13/0272 (2013.01);
Abstract

A measurement instrument receives an analog input signal from a measurement target, converts the input signal into a digital signal, scans the digital signal and comparing the scanned digital signal with a pattern signature using a flexible matching procedure implemented by hardware, and triggers the measurement instrument according to a result of the flexible matching procedure.


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