The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2019
Filed:
Sep. 11, 2009
Kathryn A. Bassin, Endicott, NY (US);
Steven Kagan, Oakbrook Terrace, IL (US);
Shao C. LI, Beijing, CN;
Zhong J. LI, Beijing, CN;
He H. Liu, Beijing, CN;
Susan E. Skrabanek, Atlanta, GA (US);
Hua F. Tan, Beijing, CN;
Jun Zhu, Shanghai, CN;
Kathryn A. Bassin, Endicott, NY (US);
Steven Kagan, Oakbrook Terrace, IL (US);
Shao C. Li, Beijing, CN;
Zhong J. Li, Beijing, CN;
He H. Liu, Beijing, CN;
Susan E. Skrabanek, Atlanta, GA (US);
Hua F. Tan, Beijing, CN;
Jun Zhu, Shanghai, CN;
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A method is implemented in a computer infrastructure having computer executable code tangibly embodied on a computer readable storage medium having programming instructions. The programming instructions are operable to receive data including defect analysis defect analysis starter (DAS)/defect reduction method (DRM) defect analysis data of a software development project and process the data. Additionally, the programming instructions are operable to determine one or more business metrics based on the data and generate at least one report based on the one or more business metrics. The one or more business metrics comprises at least one of a benefit for shifting defect removal earlier, a benefit for preventing an injection of defects, a benefit for reducing a cycle time, a benefit of reducing invalid defects and a benefit for reducing production defects.