The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2019

Filed:

Jul. 28, 2014
Applicant:

Ictk Holdings Co., Ltd., Seongnam-si, KR;

Inventors:

Dong Kyue Kim, Seoul, KR;

Byong Deok Choi, Seoul, KR;

Kwang Hyun Jee, Gyeonggi-do, KR;

Assignee:

ICTK Holdings Co., Ltd., Seongnam-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/273 (2006.01); G09C 1/00 (2006.01); H03K 23/00 (2006.01); H04L 9/06 (2006.01); H04L 9/08 (2006.01); G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
G06F 11/273 (2013.01); G06F 11/2205 (2013.01); G09C 1/00 (2013.01); H03K 23/004 (2013.01); H04L 9/0656 (2013.01); H04L 9/0866 (2013.01); H04L 2209/26 (2013.01);
Abstract

A randomness testing apparatus is disclosed. A randomness testing apparatus according to an embodiment includes a randomness testing module to conduct a randomness test on physically unclonable function (PUF)-based hardware and a processing device to determine whether the PUF-based hardware is defective on the basis of a randomness test result.


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