The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2019
Filed:
Nov. 15, 2016
Nec Laboratories America, Inc., Princeton, NJ (US);
Kai Zhang, Monmouth Junction, NJ (US);
Jianwu Xu, Lawrenceville, NJ (US);
Hui Zhang, Princeton Junction, NJ (US);
Guofei Jiang, Princeton, NJ (US);
NEC Corporation, , JP;
Abstract
An exemplary method for detecting one or more anomalies in a system includes building a temporal causality graph describing functional relationship among local components in normal period; applying the causality graph as a propagation template to predict a system status by iteratively applying current system event signatures; and detecting the one or more anomalies of the system by examining related patterns on the template causality graph that specifies normal system behaviors. The system can align event patterns on the causality graph to determine an anomaly score.