The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2019
Filed:
Feb. 03, 2017
Olympus Corporation, Hachioji-shi, Tokyo, JP;
Akihiro Fujii, Tokyo, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
A confocal microscope apparatus includes an image acquisition unit configured to obtain a first all-in-focus image of each of a plurality of measurement visual field areas constituting a measurement target area in a brightness setting in accordance with the corresponding measurement visual field area, and a stitched image constructor configured to construct a stitched image on the basis of a plurality of second all-in-focus images. The second all-in-focus images are obtained through conversion of the plurality of first all-in-focus images obtained by the image acquisition unit so that the images become closer to a plurality of reference all-in-focus images. The plurality of reference all-in-focus images are obtained when the plurality of measurement visual field area are captured in a brightness setting serving as a reference.