The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2019
Filed:
Oct. 01, 2015
Leica Microsystems (Schweiz) Ag, Heerbrugg, CH;
Harald Schnitzler, Lüchingen, CH;
Georg Schlaffer, Heerbrugg, CH;
Leica Microsystems (Schweiz) AG, Heerbrugg, CH;
Abstract
The invention relates to a microscope () that encompasses an objective system () and a zoom system (). The microscope furthermore has a diaphragm () for limiting the aperture of the beam path. A control unit () is furthermore provided, that control unit () automatically ascertaining, as a function of the current manifestation of at least one parameter of the microscope (), a respective setting of the diaphragm () predetermined for the current manifestation, and setting the diaphragm () accordingly.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile