The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2019
Filed:
Nov. 23, 2015
Robert David Frankel, Rochester, NY (US);
Robert David Frankel, Rochester, NY (US);
Other;
Abstract
The specification relates to a microscopy system. The microscopy system includes a first laser emitting a first laser pulse, the first laser pulse being a pump beam; a second laser emitting a second laser pulse, the second laser pulse being a probe beam; time delay components for delaying the probe beam, wherein the time delay components delay the probe beam by 0.3 ps to 5 ns relative to the pump beam; an optical device for combining the pump beam and the delayed probe beam into a combined laser pulse, the combined laser pulse having a reduced focal spot size; a galvanometer scanning system for delivering the combined laser pulse to a focal spot in a focal plane, wherein the reduced focal spot size of the combined laser pulse initiates a stimulated emission of a targeted molecule, the stimulated emission having dipole-like backscatter, and a detector for detecting the dipole-like backscatter.