The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2019
Filed:
Apr. 17, 2018
Jasco Corporation, Tokyo, JP;
JASCO Corporation, Tokyo, JP;
Abstract
The problem to be solved by the present invention is to provide an infrared microscope with good measuring accuracy and less crosstalk. The infrared microscopecomprises a light source, an irradiating unitfor irradiating the infrared light from the light source to a sample, a focusing unitfor focusing the infrared light transmitted through or reflected by the sample, and a detectorfor detecting the focused infrared light. The irradiating unitcomprises a first aperture, and the first aperture is disposed at a position where the infrared light from the light source passes therethrough. The focusing unitcomprises a second aperture, and the second aperture is disposed at an imaging position of the infrared light at the first aperture. The first aperture has a plurality of holes, and the holes are disposed at intervals corresponding to the arrangement of the light-receiving elements provided in the detectorto detect the infrared light as a detecting light. The second aperturehas holes that have the same size and arrangement as the first aperture