The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2019

Filed:

Jun. 19, 2015
Applicant:

Chaoshun HU, Houston, TX (US);

Inventor:

Chaoshun Hu, Houston, TX (US);

Assignee:

Chevron U.S.A. Inc., San Ramon, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 1/32 (2006.01); G01V 1/28 (2006.01); G01V 1/30 (2006.01);
U.S. Cl.
CPC ...
G01V 1/282 (2013.01); G01V 1/303 (2013.01); G01V 2210/51 (2013.01); G01V 2210/67 (2013.01); G01V 2210/679 (2013.01);
Abstract

A method is described for high-resolution seismic imaging of complex subsurface volumes using a two-stage least-squares reverse time migration with two objective functions. A traveltime misfit objective function enables long-wavelength imaging and an amplitude misfit objective function enables short-wavelength imaging. The method may be executed by a computer system.


Find Patent Forward Citations

Hu, Chaoshun. (2019). System and method for high resolution seismic imaging (U.S. Patent No. 10234581). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10234581

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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