The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2019
Filed:
Apr. 24, 2015
Applicants:
Junmin Liu, London, CA;
Maria Drangova, London, CA;
Inventors:
Junmin Liu, London, CA;
Maria Drangova, London, CA;
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/24 (2006.01); G01R 33/44 (2006.01); G01R 33/565 (2006.01); A61B 5/055 (2006.01); G01R 33/48 (2006.01); A61B 5/00 (2006.01); G01R 33/50 (2006.01);
U.S. Cl.
CPC ...
G01R 33/443 (2013.01); A61B 5/055 (2013.01); A61B 5/4872 (2013.01); G01R 33/243 (2013.01); G01R 33/4828 (2013.01); G01R 33/56563 (2013.01); G01R 33/50 (2013.01);
Abstract
Various embodiments of the present disclosure present unwrapping based B0 mapping systems and methods. An initial B0 map is obtained by unwrapping a pseudo-in-phase complex data that is generated from selected echoes of multi-echo gradient echo image data. Global and local phase errors that are present in the initial B0 map are corrected to produce a phase-error-corrected B0 map. A bias frequency shift is employed to produce a corrected fat-fraction map based on the phase-error-corrected B0 map. The corrected fat-fraction map is employed to generate a final B0 map.