The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2019
Filed:
Aug. 01, 2016
Keysight Technologies, Inc., Loveland, CO (US);
Martin W. Dvorak, Santa Rosa, CA (US);
Ben Keppeler, Loveland, CA (US);
Keysight Technologies, Inc., Santa Rosa, CA (US);
Abstract
Techniques and test structures for determining reliability and performance characteristics of an integrated circuit (IC) device are disclosed. For example, an IC device includes multiple functional elements and multiple test elements. The test elements are electrically coupled in series between a first test port and a second test port. A method of testing the IC device includes applying an electrical stimulus between the first test port and the second test port, measuring a parametric value in response to the electrical stimulus, comparing the parametric value and a statistical value, and determining a pass or fail status of the IC device. The statistical value is representative of a predicted reliability of the IC device.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile