The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2019

Filed:

Aug. 30, 2016
Applicant:

Atc Logistics & Electronics, Inc., Fort Worth, TX (US);

Inventors:

Carlos Valmonte Jimenez, Keller, TX (US);

Jimmie Paul Partee, Double Oak, TX (US);

Fredrick Oluoch Onyango, Keller, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01); G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
G01R 29/10 (2013.01); G01R 29/0821 (2013.01);
Abstract

A system for testing radio frequency (RF) characteristics of a wireless device includes a test fixture. The test fixture includes a base plate that receives a wireless device, and a back plate that receives an RF antenna and positions the RF antenna relative to the wireless device. Additionally, the system includes test equipment that in operation performs RF testing on the wireless device using the RF antenna to determine RF characteristics of the wireless device.


Find Patent Forward Citations

Jimenez, Carlos. (2019). System and method for rf testing (U.S. Patent No. 10234494). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10234494

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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