The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2019
Filed:
Feb. 07, 2014
Applicant:
Rockwool International A/s, Hedehusene, DK;
Inventor:
Jacob Frank De Groot, Roermond, NL;
Assignee:
ROCKWOOL INTERNATIONAL A/S, , DK;
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/00 (2006.01); A01G 25/16 (2006.01); A01G 31/02 (2006.01); G01N 27/02 (2006.01); G01N 27/04 (2006.01); G01N 27/22 (2006.01); A01G 24/18 (2018.01);
U.S. Cl.
CPC ...
G01N 33/0098 (2013.01); A01G 25/167 (2013.01); A01G 31/02 (2013.01); G01N 27/028 (2013.01); G01N 27/041 (2013.01); G01N 27/223 (2013.01); A01G 24/18 (2018.02); Y02P 60/216 (2015.11);
Abstract
A device () and method are provided for measuring the plant growth conditions within a substrate. A first and a second linear arrays of probes () are used, allowing multiple measurements of properties of the substrate. Using multiple measurements at different levels in the substrate and then combining these multiple measurements, allows plant growth conditions to be accurately derived.