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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10234388 B1

PDFFull Text
Date of Patent:
Mar. 19, 2019

Filed:

Feb. 05, 2016

System for determining abnormality in a monitored area

Applicant:

Hochiki Corporation, Tokyo, JP;

Inventors:

Hiromichi Ebata, Tokyo, JP;

Atsushi Mammoto, Tokyo, JP;

Assignee:

HOCHIKI CORPORATION, Tokyo, JP;

Attorney:

Shumaker, Loop & Kendrick, LLP

Primary Examiner:

Shawn Decenzo

Int. Cl.
CPC ...
G01N 21/53 (2006.01); G01N 21/61 (2006.01); G08B 17/10 (2006.01); G08B 21/14 (2006.01); G08B 29/18 (2006.01); G01N 27/416 (2006.01); G08B 17/107 (2006.01); G08B 17/117 (2006.01);
U.S. Cl.
CPC ...
G01N 21/61 (2013.01); G01N 21/53 (2013.01); G01N 27/4162 (2013.01); G08B 17/10 (2013.01); G08B 17/117 (2013.01); G08B 29/188 (2013.01); G08B 17/107 (2013.01); G08B 21/14 (2013.01);
Abstract

A system including a first information acquisition unit configured to acquire first information indicating a detection value of a first physical quantity in a monitored area, a second information acquisition unit configured to acquire second information indicating a detection value of a second physical quantity different from the first physical quantity, in the monitored area, and a determination unit configured to determine whether an abnormality has occurred in the monitored area, based on the detection value of the first physical quantity indicated by the first information, the detection value of the second physical quantity indicated by the second information, a first coefficient corresponding to the detection value of the first physical quantity and the detection value of the second physical quantity, and a first threshold.

Find Patent Forward Citations

Ebata, Hiromichi. (2019). System for determining abnormality in a monitored area (U.S. Patent No. 10234388). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10234388

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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