The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2019
Filed:
Dec. 06, 2017
Hitachi, Ltd., Chiyoda-ku, Tokyo, JP;
Takuya Kanbayashi, Tokyo, JP;
Shinichi Taniguchi, Tokyo, JP;
Akihiro Nojima, Tokyo, JP;
Yusuke Kaga, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
The invention optically analyzes a component in a sample having a material suspended. An optical analysis system that irradiates a liquid sample with light and analyzes a component of the sample using transmitted light transmitted through the sample includes a container accommodating the sample and an ultrasonic irradiation unit irradiating an ultrasonic wave for exciting the sample. The container includes a pair of light transmission wall portions between which the sample is disposed and which has light transmissivity, and one of the light transmission wall portions and the other of the light transmission wall portions are disposed to be separated from each other at a distance shorter than a wavelength of the ultrasonic wave.