The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2019
Filed:
Jul. 30, 2014
Applicant:
Hitachi, Ltd., Tokyo, JP;
Inventors:
Assignee:
HITACHI, LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 17/007 (2006.01); B60W 50/00 (2006.01); G05B 23/02 (2006.01); G07C 5/08 (2006.01);
U.S. Cl.
CPC ...
G01M 17/007 (2013.01); B60W 50/00 (2013.01); G05B 23/0227 (2013.01); G05B 23/0275 (2013.01); G07C 5/08 (2013.01);
Abstract
A degradation cause estimation device is provided with a degradation detector for detecting the amount of degradation undergone by a device, a state observation device for detecting observation values for internal portions, values observed from outside, or device control and operation information, a degradation section detector for detecting a section undergoing degradation using the output values of the degradation detector, and a cause estimator for estimating the cause of the degradation using the device state observations for the degradation section, and outputs the cause for the degradation section.