The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2019
Filed:
Jun. 11, 2015
Ge-hitachi Nuclear Energy Americas Llc, Wilmington, NC (US);
Timothy W. Clark, Wilmington, NC (US);
Robert William Viren, Wilmington, NC (US);
GE-Hitachi Nuclear Energy Americas LLC, Wilmington, NC (US);
Abstract
A system and method for conducting Non-Destructive Examination (NDE) inspections and integrating inspection data with encoding information may include a NDE probe configured to conduct a non-destructive examination of an object, a shape sensing fiber optic cable attached to the NDE probe, the fiber optic cable configured to receive a frequency of light and to reflect the received light, a fiber optic cable shape sensing detector configured to generate light of the frequency, measure the shape of the shape sensing fiber optic cable based on the reflected light from the shape sensing fiber optic cable, and determine position information and orientation information of the NDE probe based on the measured shape of the fiber optic cable, and a processor configured to encode the examination data, the encoding including correlating the position information and the orientation information with the examination data.