The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2019
Filed:
Oct. 29, 2015
Abo Akademi (Abo Akademi University), Turku, FI;
Helsingin Yliopisto, Helsingin Yliopisto, FI;
Edward Hæggstrom, Helsinki, FI;
Ivan Kassamakov, Helsinki, FI;
Anton Nolvi, Jarvenpaa, FI;
Tuomo Ylitalo, Helsinki, FI;
Niklas Sandler, Helsinki, FI;
Tapani Viitala, Espoo, FI;
Johan Nyman, Abo, FI;
ABO AKADEMI (ABO AKADEMI UNIVERSITY), Turku, FI;
HELSINGIN YLIOPISTO, Helsingin Yliopsto, FI;
Abstract
A method for calibrating electromagnetic radiation-based three-dimensional imaging includes: obtaining () a calibration imaging result at least partly on the basis of electromagnetic waves received from a calibration artifact, forming () calibration data on the basis of the calibration imaging result and a known thickness profile of the calibration artifact, and correcting (), with the aid of the calibration data, an imaging result obtained at least partly on the basis of electromagnetic waves received from a sample to be imaged. The calibration artifact includes layers, for example Langmuir-Blodgett films, having pre-determined thicknesses and stacked on each other so as to achieve the pre-determined thickness profile of the calibration artifact. A three-dimensional imaging system configured to carry out the method.