The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2019

Filed:

Mar. 18, 2015
Applicant:

Ngk Insulators, Ltd., Nagoya, JP;

Inventors:

Makoto Miyahara, Nagoya, JP;

Makiko Ichikawa, Nagoya, JP;

Kenji Yajima, Nagoya, JP;

Shinji Nakamura, Nagoya, JP;

Ryujiro Nagasaka, Nagoya, JP;

Assignee:

NGK Insulators, Ltd., Nagoya, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B32B 33/00 (2006.01); B29C 73/00 (2006.01); B32B 43/00 (2006.01); B29C 65/00 (2006.01); B32B 37/00 (2006.01); B01D 39/00 (2006.01); B01D 41/00 (2006.01); B01D 45/00 (2006.01); B01D 46/00 (2006.01); B01D 49/00 (2006.01); B01D 50/00 (2006.01); B01D 51/00 (2006.01); B01D 59/50 (2006.01); F01N 3/00 (2006.01); F01N 3/02 (2006.01); B01D 65/10 (2006.01); B01D 63/06 (2006.01); B01D 65/00 (2006.01); B01D 69/02 (2006.01); B01D 71/02 (2006.01); B29C 73/02 (2006.01); B29C 73/06 (2006.01); G01N 15/08 (2006.01); G01M 3/32 (2006.01); G01M 3/34 (2006.01); B32B 3/12 (2006.01); B29C 70/76 (2006.01); B29K 79/00 (2006.01); B29L 31/14 (2006.01);
U.S. Cl.
CPC ...
B01D 65/108 (2013.01); B01D 63/066 (2013.01); B01D 65/003 (2013.01); B01D 65/102 (2013.01); B01D 65/104 (2013.01); B01D 65/106 (2013.01); B01D 69/02 (2013.01); B01D 71/021 (2013.01); B01D 71/027 (2013.01); B01D 71/028 (2013.01); B29C 73/02 (2013.01); B29C 73/06 (2013.01); G01M 3/3254 (2013.01); G01M 3/34 (2013.01); G01N 15/08 (2013.01); B01D 2325/24 (2013.01); B29C 70/766 (2013.01); B29K 2079/08 (2013.01); B29K 2995/0068 (2013.01); B29L 2031/14 (2013.01); B32B 3/12 (2013.01);
Abstract

Each cell is pressurized with gas from outside of the cell, the amount of permeation of the gas permeated into each cell is measured, and a cell having the amount of permeation greater than (average value of all cells+A) (wherein A is a predetermined value of σ to 6σ, where σ is the standard deviation) is considered to be defective. Alternatively, pressure is reduced for each cell, the degree of vacuum in each cell is measured, and a cell having the degree of vacuum worse than (average value of all cells+A) is considered to be defective. Then, a polymer compound is poured into the defective cells of the monolithic separation membrane structure and cured so that the defective cells are sealed. Alternatively, the polymer compound formed in advance as the sealing member is inserted into the defective cells to seal the defective cells.


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