The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2019
Filed:
Aug. 08, 2014
Samsung Electronics Co., Ltd., Suwon-si, KR;
Seok Min Han, Seongnam-si, KR;
Dong Goo Kang, Hwaseong-si, KR;
Young Hun Sung, Hwaseong-si, KR;
Jae Hak Lee, Yongin-si, KR;
Ji Young Choi, Suwon-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
Provided is an X-ray imaging apparatus including: an image generation unit configured to generate an X-ray image based on X-rays transmitted by an object; a thickness measurement unit configured to measure thickness information of the object and generate a reference phantom image in which the measured thickness information is indicated; and an image separation unit configured to generate a final image obtained by separating a material inside the object from the X-ray image using the reference phantom image.