The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2019

Filed:

Sep. 29, 2015
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Satoshi Naito, Ashigarakami-gun, JP;

Takahiro Kawamura, Ashigarakami-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 8/08 (2006.01);
U.S. Cl.
CPC ...
A61B 6/547 (2013.01); A61B 6/4417 (2013.01); A61B 6/588 (2013.01); A61B 6/5294 (2013.01); A61B 8/0858 (2013.01);
Abstract

The distance between the radiation source and an object (SOD value) is acquired, distance dependent information which is obtained from a radiation image and changes with the distance between a radiation source and a radiation detector (SID value) is acquired, a temporary thickness of the object is determined by a first function representing the correspondence relationship of first information having at least one piece of the distance dependent information, the SID value, and the thickness of the object, and the temporary SID value is determined by adding the SOD value to the determined value. The thickness of the object is determined by a second function representing the correspondence relationship of second information having at least one piece of the distance dependent information, the SID value, and the thickness of the object, and the SID value is determined by adding the SOD value to the determined value.


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