The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2019

Filed:

Dec. 25, 2016
Applicant:

Renesas Electronics Corporation, Koutou-ku, Tokyo, JP;

Inventors:

Satoshi Kaneko, Tokyo, JP;

Takashi Ienaga, Tokyo, JP;

Kazumi Ishii, Tokyo, JP;

Akio Fujii, Tokyo, JP;

Takahisa Gunji, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05B 37/02 (2006.01); G01R 29/027 (2006.01); H04L 1/20 (2006.01);
U.S. Cl.
CPC ...
H05B 37/0254 (2013.01); G01R 29/027 (2013.01); H04L 1/205 (2013.01); H05B 37/0227 (2013.01);
Abstract

The invention provides a semiconductor device capable of diagnosing communication network quality. Disclosed is a semiconductor device that is coupled to a light source, the semiconductor device including a signal processing unit that is coupled to an interface module and transmits and receives a command signal to increase or decrease illumination intensity of the light source and a deterioration detector that detects deterioration of the interface module, based on whether or not change timing of a signal representing data of a command signal received by the interface module falls within a predetermined interval.


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