The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2019
Filed:
Nov. 17, 2015
Wipro Limited, Bangalore, IN;
Venkata Subramanian Jayaraman, Chennai, IN;
Sumithra Sundaresan, Chennai, IN;
Wipro Limited, Bangalore, IN;
Abstract
A system and method for improving integration testing in a cloud computing environment includes collecting one or more input parameters associated with each of one or more products, deployed in cloud computing environment, from one or more external resources and test management systems. The input parameters include one or more defect parameters, user requirements, test parameters or performance parameters associated with the product. The integration testing improvement system determines one or more failure issues associated with the product and analyzes the behavior of the product over a predetermined time period to identify a failure pattern associated with the product. Each of the determined failure issues is mapped with the identified failure pattern to detect one or more critical scenarios in each of the products. Later the critical scenarios are automated by executing associated test scripts thereby improving the integration testing in the cloud computing environment.