The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2019
Filed:
Jul. 28, 2016
Applicant:
Ets-lindgren Inc., Cedar Park, TX (US);
Inventor:
Michael David Foegelle, Cedar Park, TX (US);
Assignee:
ETS-Lindgren Inc., Cedar Park, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H04W 24/06 (2009.01); H04B 17/364 (2015.01); H04W 72/04 (2009.01); H04B 1/04 (2006.01);
U.S. Cl.
CPC ...
H04B 17/0087 (2013.01); H04B 17/0085 (2013.01); H04B 17/364 (2015.01); H04W 24/06 (2013.01); H04W 72/042 (2013.01); H04B 2001/0408 (2013.01);
Abstract
A method and system for measuring a device under test are disclosed. In some embodiments, an electromagnetic measurement system to test a device under test, DUT is provided. The system includes, at a central location, an emulator core configured to introduce an impairment in each of at least one transmit signal to produce a digital impaired signal; and at a remote location, a transmitter configured to convert the digital impaired signal to an analog RF signal.