The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2019

Filed:

Apr. 01, 2016
Applicant:

Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Inventors:

Lukasz Borowik, Sassenage, FR;

Nicolas Chevalier, Chabons, FR;

Sylvain Pouch, Grenoble, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02S 50/15 (2014.01); G01Q 60/30 (2010.01);
U.S. Cl.
CPC ...
H02S 50/15 (2014.12); G01Q 60/30 (2013.01);
Abstract

A method determines the carrier lifetime in a point of a surface of a sample, and includes in absence of illumination, measuring, at the point, a parameter P via atomic force microscopy technique (AFM) to obtain a value P. The point is illuminated with a continuous light beam and the parameter P is measured, at the point, via AFM to obtain a value P. The point is successively illuminated with continuous modulated light beams each having a different frequency fthat varies between a minimum frequency fand a maximum frequency f, with the modulated light beams having a duty cycle D. For each modulated light beam, the parameter P is measured, at the point, via AFM in such a way as to obtain a value Pfor each frequency f. The carrier lifetime is calculated on point with the values of P, P, the duty cycle D, and f.


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